Non-contact surface measurement system "CT350"
Achieves high-resolution 3D optical measurement within a maximum range of 350×350mm². Supports extensive surface analysis with six types of sensor technologies.
The high-precision non-contact surface measurement system 'CT350' supports high-resolution optical measurement and analysis over a maximum range of 350×350mm², and can be equipped with up to six different sensor technologies, including chromatic aberration confocal and 3D white light interferometers. It flexibly accommodates precise measurements at a Z-axis resolution of 0.1nm level, thin film measurements, and high-resolution image analysis, strongly supporting quality evaluation and surface shape analysis of various materials such as semiconductors and electronic components. 【Features】 ■ Wide measurement range of up to 350×350mm² and support for high-resolution optical analysis ■ Capable of accommodating up to six types of sensor technologies, including chromatic aberration confocal and interferometers ■ Achieves precise surface shape and thickness measurements with a Z-axis resolution of 0.1nm level *For more details, please download the PDF or feel free to contact us.
- Company：株式会社 Found Four
- Price：Other
